Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces

被引：148
|
作者：
Priest, RG [1 ]
Meier, SR [1 ]
机构：
[1] USN, Res Lab, Div Opt Sci, Washington, DC 20375 USA
来源：
OPTICAL ENGINEERING | 2002年 / 41卷 / 05期
关键词：
polarization; scattering; infrared;
D O I：
10.1117/1.1467360
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We investigate the polarimetric scattering properties of highly absorbing and highly reflective rough surfaces in the IR. We obtain Mueller matrix measurements from these surfaces and compare the data to a Fresnel model. From the data, we determine that a rough, highly absorbing surface has a higher degree of polarization compared to a rough, highly reflective surface. In addition, we present a full polarimetric version of the microfacet model and discuss its properties. This closed-form result for the polarimetric bidirectional reflectance distribution function (BRDF) is derived from the microfacet model. (C) 2002 Society of Photo-Optical instrumentation Engineers.
引用
收藏
页码：988 / 993
页数：6
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