Study of loss in superconducting coplanar waveguide resonators

被引:165
|
作者
Sage, Jeremy M. [1 ]
Bolkhovsky, Vladimir [1 ]
Oliver, William D. [1 ]
Turek, Benjamin [1 ]
Welander, Paul B. [1 ]
机构
[1] MIT, Lincoln Lab, Lexington, MA 02420 USA
关键词
BOROSILICATE GLASS; OXIDATION; XPS;
D O I
10.1063/1.3552890
中图分类号
O59 [应用物理学];
学科分类号
摘要
Superconducting coplanar waveguide (SCPW) resonators have a wide range of applications due to the combination of their planar geometry and high quality factors relative to normal metals. However, their performance is sensitive to both the details of their geometry and the materials and processes that are used in their fabrication. In this paper, we study the dependence of SCPW resonator performance on materials and geometry as a function of temperature and excitation power. We measure quality factors greater than 2 x 10(6) at high excitation power and 6 x 10(5) at a power comparable to that generated by a single microwave photon circulating in the resonator. We examine the limits to the high excitation power performance of the resonators and find it to be consistent with a model of radiation loss. We further observe that while in all cases the quality factors are degraded as the temperature and power are reduced due to dielectric loss, the size of this effect is dependent on resonator materials and geometry. Finally, we demonstrate that the dielectric loss can be controlled in principle using a separate excitation near the resonance frequencies of the resonator. (C) 2011 American Institute of Physics. [doi:10.1063/1.3552890]
引用
收藏
页数:10
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