Metrology, essential to trade, industry and society

被引：3

作者：

Kaarls, Robert ^{[1
]}

机构：

[1] CCQM, CIPM, NL-2381 VX Zoeterwoude, Netherlands

来源：

关键词：

metrology; economic and societal impact; technical barriers to trade; proficiency testing; CRMs; CIPM MRA; CCQM;

D O I：

10.1007/s00769-007-0301-6

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：435 / 437

页数：3

共 50 条

[1] Metrology, essential to trade, industry and society
Robert Kaarls
[J]. Accreditation and Quality Assurance, 2007, 12 : 435 - 437
[2] Leak rate metrology for the society and industry
Bergoglio, M.
Mari, D.
[J]. MEASUREMENT, 2012, 45 (10) : 2434 - 2440
[3] METROLOGY AND INDUSTRY
BRAY, A
[J]. ELETTROTECNICA, 1985, 72 (06): : 533 - 545
[4] The metrology behind trade
Pavel Klenovsky
Marc Wouters
Wilfried de Waal
[J]. Nature Physics, 2022, 18 : 842 - 842
[5] The metrology behind trade
Klenovsky, Pavel
Wouters, Marc
de Waal, Wilfried
[J]. NATURE PHYSICS, 2022, 18 (07) : 842 - 842
[6] The metrology behind trade
Klenovsky, Pavel
Wouters, Marc
de Waal, Wilfried
[J]. Nature Physics, 2022, 18 (07):
[7] ENTREPRIZES, TRADE AND INDUSTRY, AND SOCIETY - GERMAN - WILLEMS,JGLM
SCHENK, H
[J]. ECONOMIST, 1978, 126 (03): : 438 - 440
[8] The coordinate metrology society
Jones, Belinda
[J]. Photonics Spectra, 2020, 54 (05): : 62 - 64
[9] Metrology for the optoelectronics industry
Day, GW
[J]. HARNESSING LIGHT: OPTICAL SCIENCE AND METROLOGY AT NIST, 2001, 4450 : 33 - 43
[10] Worldwide trade needs metrology
Kind, D
[J]. ZUCKERINDUSTRIE, 1998, 123 (07): : 498 - 500