The metrology behind trade

被引：0
|
作者：
Klenovsky, Pavel [1 ]
Wouters, Marc [1 ]
de Waal, Wilfried [1 ]
机构：
[1] WELMEC, Braunschweig, Germany
来源：
NATURE PHYSICS | 2022年 / 18卷 / 07期
关键词：
D O I：
10.1038/s41567-022-01670-4
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The impact of legal metrology often remains unnoticed in our everyday lives. Pavel Klenovsky, Marc Wouters and Wilfried de Waal instruct us in trade and legal regulations.
引用
收藏
页码：842 / 842
页数：1
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