Strength and fractographic analysis of chalcogenide As-S-Se and Ge-As-Se-Te glass fibers

被引:12
|
作者
Quinn, JB
Nguyen, VQ
Sanghera, JS
Lloyd, IK
Pureza, PC
Miklos, RE
Aggarwal, ID
机构
[1] Natl Inst Stand & Technol, Amer Dent Assoc Hlth Fdn, Paffenbarger Res Ctr, Gaithersburg, MD 20899 USA
[2] USN, Res Lab, Code 5606, Washington, DC 20375 USA
[3] Univ Maryland, Dept Mat & Nucl Engn, College Pk, MD 20742 USA
[4] SFA Inc, Largo, MD 20774 USA
关键词
D O I
10.1016/S0022-3093(03)00309-0
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The strengths and Weibull parameters of chalcogenide As-S-Se and Ge-As-Se-Te glass fibers were measured, and the fiber fracture surfaces examined. The sulfide (As-S-Se) fibers have a mean strength of 545 MPa, characteristic strength of 567 MPa, and Weibull slope, m, of 8.5. The weaker telluride (Ge-As-Se-Te) fibers have a mean strength of 427 MPa, characteristic strength of 441 MPa, and a Weibull slope of 11. Fractographic analysis indicates the sources of failure in these glass fibers are inclusions, microbubbles and microcracks. Fracture mirror measurements enabled estimations of fracture toughness and mean critical flaw sizes. The lower strength of the Ge-As-Se-Te glass fibers was determined to be a consequence of a more severe flaw population. (C) 2003 Elsevier B.V. All rights reserved.
引用
收藏
页码:150 / 157
页数:8
相关论文
共 50 条
  • [21] Thermal analysis of quaternary Ge–Se–Sb–Te chalcogenide alloys
    Neha Sharma
    Sunanda Sharda
    Vineet Sharma
    Pankaj Sharma
    Journal of Thermal Analysis and Calorimetry, 2015, 119 : 213 - 218
  • [22] Structural study of chalcogenide Ge20Se50Te30 glass
    Abdel-Rahim, MN
    Abdel-Latif, AY
    Soltan, AS
    PHYSICA B, 2000, 291 (1-2): : 41 - 48
  • [23] OXIDE IMPURITY ABSORPTIONS IN GE-SE-TE GLASS-FIBERS
    NISHII, J
    YAMASHITA, T
    YAMAGISHI, T
    JOURNAL OF MATERIALS SCIENCE, 1989, 24 (12) : 4293 - 4297
  • [24] ELECTRICAL PROPERTIES OF CHALCOGENIDE GLASSES OF TE-SE-GE AND TE-SE-SB SYSTEMS
    SAKAI, H
    SHIMAKAWA, K
    INAGAKI, Y
    ARIZUMI, T
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1974, 13 (03) : 500 - 503
  • [25] VITRIFICATION IN THE GE-S-SE, GE-S-TE, AND GE-SE-TE SYSTEMS
    MAKOVSKAYA, ZG
    ZHUKOV, EG
    INORGANIC MATERIALS, 1980, 16 (02) : 161 - 163
  • [26] Application of As-S-Se chalcogenide inorganic resists in diffractive optics
    Stronski, AV
    SELECTED PAPER FROM INTERNATIONAL CONFERENCE ON OPTICS AND OPTOELECTRONICS '98: SILVER JUBILEE SYMPOSIUM OF THE OPTICAL SOCIETY OF INDIA, 1999, 3729 : 250 - 254
  • [27] High efficiency of Brillouin scattering behavior in single-mode Ge-As-Se-Te fibers at 2 μm
    Fu, Yue
    Dai, Shi-Xun
    Xu, Lu-Lu
    Fang, Yao-Jun
    Wang, Ying-Ying
    Jiao, Kai
    Wang, Xun-Si
    CHINESE PHYSICS B, 2023, 32 (05)
  • [28] Exploring amorphous Ge-As-Se-Te as an active layer candidate in memristive devices
    Correr, Wagner
    Chouinard, Corinne
    Messaddeq, Sandra
    Messaddeq, Younes
    MATERIALS TODAY ELECTRONICS, 2023, 6
  • [29] Photoinduced Bragg reflectors in As-S-Se/As-S based chalcogenide glass multilayer channel waveguides
    Saliminia, A
    Le Foulgoc, K
    Villeneuve, A
    Galstian, T
    FIBER AND INTEGRATED OPTICS, 2001, 20 (02) : 151 - 158
  • [30] Thermal analysis of quaternary Ge-Se-Sb-Te chalcogenide alloys
    Sharma, Neha
    Sharda, Sunanda
    Sharma, Vineet
    Sharma, Pankaj
    JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY, 2015, 119 (01) : 213 - 218