A novel dynamic memory cell with internal voltage gain

被引:19
|
作者
Luk, WK [1 ]
Dennard, RH [1 ]
机构
[1] IBM Corp, Thomas J Watson Res Ctr, Yorktown Hts, NY 10598 USA
关键词
dynamic memory; gain cell; gated diode; memory cell with internal voltage gain; nondestructive read; nonlinear capacitor; nonlinear voltage boosting;
D O I
10.1109/JSSC.2004.842854
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A 2T1D dynamic memory cell with two transistors (T) and a gated diode (D) is presented. A gated diode is a two terminal MOS device in which charge is stored when a voltage above the threshold voltage is applied between the gate and the source, and negligible charge is stored otherwise. The gated diode acts as a nonlinear capacitance for voltage boosting, where voltage for 1-data is boosted high and voltage for 0-data stays low, achieving significant voltage gain of the internal stored voltage, higher signal margin, higher current drive and low-voltage memory operation. Details about the gated diode structure, its signal amplification, the memory cell circuits and the array structure, some hardware and test results are presented, followed by comparison to other memory cells and future directions.
引用
收藏
页码:884 / 894
页数:11
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