Fabrication of self-assembled InGaAs, GaAs, and InAs quantum dots by chemical beam epitaxy

被引:0
|
作者
Ro, JR [1 ]
Kim, SB
Lee, EH
Park, SJ
机构
[1] Elect & Telecommun Res Inst, Taejon 305600, South Korea
[2] Kwangju Inst Sci & Technol, Kwangju 506303, South Korea
关键词
chemical beam epitaxy; GaAs; InAs; InGaAs; quantum dots;
D O I
10.1016/S0167-9317(98)00191-9
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report on the fabrication of self-assembled GaAs, InGaAs and InAs quantum dots (QD) on GaAs(100) via droplet epitaxy and S-K mode growth by chemical beam epitaxy (CBE). Triethylgallium, trimethylindium, monoethylarsine, and arsine were applied as source materials. GaAs and InGaAs quantum dots with diameter 50 nm and density 1x10(9) cm(-2) were grown by Ga droplet formation and the successive supply of source materials without any pre-treatment steps prior to growth. InAs quantum dots were coherently assembled on a lattice-mismatched GaAs substrate without any indication of misfit dislocation in the Stranski-Krastanow (S-K) growth method. The areal density of 40 nm sized InAs islands was obtained up to 10(10) cm(-2) by changing the deposition thickness. Our results demonstrate that CBE can be a very powerful method for the growth of self-assembled quantum dots. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:11 / 18
页数:8
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