Non-zero-crossing current-voltage hysteresis behavior in memristive system

被引:76
|
作者
Sun, B. [1 ,2 ]
Xiao, M. [1 ]
Zhou, G. [3 ,4 ]
Ren, Z. [4 ]
Zhou, Y. N. [1 ]
Wu, Y. A. [1 ]
机构
[1] Univ Waterloo, Ctr Adv Mat Joining, Waterloo Inst Nano Technol, Dept Mech & Mechatron Engn, Waterloo, ON N2L 3G1, Canada
[2] Southwest Jiaotong Univ, Minist Educ China, Sch Phys Sci & Technol, Key Lab Adv Technol Mat, Chengdu 610031, Sichuan, Peoples R China
[3] Southwest Univ, Sch Artificial Intelligence, Chongqing 400715, Peoples R China
[4] Southwest Univ, ICEAM, Chongqing 400715, Peoples R China
基金
加拿大自然科学与工程研究理事会;
关键词
Current-voltage curves; Hysteresis behavior; Memristor; Capacitive; Ferroelectric; Internal electromotive force; RESISTIVE SWITCHING MEMORY; FERROELECTRIC POLARIZATION; DEVICE; PERFORMANCE; DIODE;
D O I
10.1016/j.mtadv.2020.100056
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Since the memristor was theoretically predicted at 1971, the research on memristor and memristive behavior has attracted great interest. However, there is a debate about the physical model of the non -zero-crossing (or named non-pinched) current-voltage (I-V) hysteresis behavior observed experimentally in many reported memristive devices. By identifying and analyzing all these non-zero-crossing hysteresis curves, we attribute this behavior to three mechanisms: the involvement of a capacitive effect, the appearance of a ferroelectric or piezoelectric polarization, and the formation of an internal electromotive force. Among them, the memristive behavior involving a capacitive effect has been reported extensively. It demonstrates that the combination of multiple physical properties (memristive and capacitive) in a single device could prefigure potential multifunctional applications. In this review, we discuss the physical mechanism of non-zero-crossing I-V curves, the related research progress with particular emphasis on the origin of non-zero-crossing I-V curves. Moreover, the existing problems in this field and the possible solutions will be discussed, providing an outlook for the future developments. (C) 2020 The Author(s). Published by Elsevier Ltd.
引用
收藏
页数:11
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