Using Magnetoresistive Sensors in Nondestructive Testing

被引:0
|
作者
Ye, Chaofeng [1 ,2 ]
Rosell, Anders [1 ]
Udpa, Lalita [1 ]
机构
[1] Michigan State Univ, Dept Elect & Comp Engn, Nondestruct Evaluat Lab, E Lansing, MI 48824 USA
[2] ShanghaiTech Univ, Sch Informat Sci & Technol, Shanghai, Peoples R China
关键词
D O I
暂无
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
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页码:144 / 154
页数:11
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