Interferometric measurement of surface shape by wavelength tuning suppressing random intensity error

被引:6
|
作者
Kim, Yangjin [1 ]
Hibino, Kenichi [2 ]
Sugita, Naohiko [1 ]
Mitsuishi, Mamoru [1 ]
机构
[1] Univ Tokyo, Dept Mech Engn, Bunkyo Ku, 7-3-1 Hongo, Tokyo 1138656, Japan
[2] Natl Inst Adv Ind Sci & Technol, 1-1-1 Umezono, Tsukuba, Ibaraki 3058563, Japan
关键词
PHASE-SHIFTING INTERFEROMETRY; COMPENSATING ALGORITHMS; OPTICAL-THICKNESS; DESIGN; DERIVATION; WAFER; NOISE;
D O I
10.1364/AO.55.006464
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this research, the susceptibility of the phase-shifting algorithms to the random intensity error is formulated and estimated. The susceptibility of the random intensity error of conventional windowed phase-shifting algorithms is discussed, and the 7N - 6 phase-shifting algorithm is developed to minimize the random intensity error using the characteristic polynomial theory. Finally, the surface shape of the transparent wedge plate is measured using a wavelength-tuning Fizeau interferometer and the 7N - 6 algorithm. The experimental results indicate that the surface shape measurement accuracy for the transparent plate is 2.5 nm. (C) 2016 Optical Society of America.
引用
收藏
页码:6464 / 6470
页数:7
相关论文
共 50 条
  • [21] Interferometric precision measurement of highly reflective thin film using wavelength tuning Fizeau interferometry
    Kim, Yangjin
    Hibino, Kenichi
    Mitsuishi, Mamoru
    EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE VI, 2019, 11032
  • [22] Influence of windows on the phase error of interferometric surface topography of a wafer using wavelength scanning
    Jeon, Jurim
    Kim, Yangjin
    Sugita, Naohiko
    JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, 2023, 37 (09) : 4809 - 4816
  • [23] Influence of windows on the phase error of interferometric surface topography of a wafer using wavelength scanning
    Jurim Jeon
    Yangjin Kim
    Naohiko Sugita
    Journal of Mechanical Science and Technology, 2023, 37 : 4809 - 4816
  • [24] Simultaneous measurement of surface shape and absolute optical thickness of a glass plate by wavelength tuning phase-shifting interferometry
    Hibino, Kenichi
    Kim, Yangjin
    Lee, Sangyu
    Kondo, Yohan
    Sugita, Naohiko
    Mitsuishi, Mamoru
    OPTICAL REVIEW, 2012, 19 (04) : 247 - 253
  • [25] Simultaneous measurement of surface shape and absolute optical thickness of a glass plate by wavelength tuning phase-shifting interferometry
    Kenichi Hibino
    Yangjin Kim
    Sangyu Lee
    Yohan Kondo
    Naohiko Sugita
    Mamoru Mitsuishi
    Optical Review, 2012, 19 : 247 - 253
  • [26] Surface shape measurement of tilted surfaces by wavelength scanning interferometry
    Yamamoto, A
    Yamaguchi, I
    Yano, M
    INTERFEROMETRY '99: APPLICATIONS, 1999, 3745 : 32 - 39
  • [27] Precise Measurement of the Surface Shape of Silicon Wafer by Using a New Phase-Shifting Algorithm and Wavelength-Tuning Interferometer
    Miao, Fuqing
    Ahn, Seokyoung
    Kim, Yangjin
    APPLIED SCIENCES-BASEL, 2020, 10 (09):
  • [28] The measurement method of heliostat surface shape error based on photogrammetry
    Xiu-dong, Wei
    Fan, Zhang
    Ying-chao, Xu
    CHINESE OPTICS, 2023, 16 (02) : 425 - 433
  • [29] DERIVATION OF SURFACE MACROROUGHNESS PARAMETERS OF A RANDOM ROUGH-SURFACE FROM AN OPTICAL INTERFEROMETRIC MEASUREMENT
    GYIMESI, M
    RICHTER, P
    LORINCZ, E
    APPLIED OPTICS, 1988, 27 (05): : 983 - 986
  • [30] The wavelength-measurement error induced by using interferometric detection schemes for fibre-grating sensors
    Shi, WJ
    Ning, YN
    Grattan, KTV
    Palmer, AW
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1997, 8 (03) : 217 - 220