LA-ICP-MS using a nitrogen plasma source

被引:13
|
作者
Neff, Christoph [1 ]
Becker, Pascal [1 ]
Hattendorf, Bodo [1 ]
Guenther, Detlef [1 ]
机构
[1] Swiss Fed Inst Technol, Inorgan Chem Lab, Dept Chem & Appl Biosci, Vladimir Prelog Weg 1, CH-8093 Zurich, Switzerland
基金
瑞士国家科学基金会;
关键词
INDUCTIVELY-COUPLED PLASMA; MICROWAVE-INDUCED PLASMA; DYNAMIC REACTION CELL; LASER-ABLATION; MASS-SPECTROMETRY; ATMOSPHERIC-PRESSURE; ION-SOURCE; QUANTITATIVE-DETERMINATION; HIGH-RESOLUTION; TRACE-ELEMENTS;
D O I
10.1039/d1ja00205h
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Here we describe the first study of a nitrogen based inductively coupled plasma mass spectrometry system in conjunction with laser ablation (LA-(N-2-ICP)-MS). Therefore, a microwave-sustained, inductively coupled, atmospheric-pressure plasma source was mounted onto the interface of a quadrupole ICP-MS to investigate the capabilities of such an instrument. The proof of concept study was focused on the quantification capabilities of major to trace elements. Therefore, the plasma background species under dry plasma conditions were investigated to identify the most suitable isotopes for the analysis and to describe the newly formed nitrogen plasma interferences. In addition, the instrumental drift was investigated. Selected elements in the reference materials NIST SRM 612 and BCR-2G were quantified using NIST SRM 610 as an external standard and could be determined within the uncertainty of the reference values. Finally, the limits of detection for LA-(N-2-ICP)-MS and LA-(Ar-ICP)-MS were compared indicating similar or even lower LODs for most elements using LA-(N-2-ICP)-MS. Therefore, a nitrogen plasma source coupled to a mass spectrometer could challenge the argon-sustained ICP-MS in element analysis by overcoming argon interferences and has the potential to reduce the plasma gas expenses significantly.
引用
收藏
页码:1750 / 1757
页数:8
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