Scintillation Characteristics of Indium Doped Cesium Iodide Single Crystal

被引:10
|
作者
Wu, Yuntao [1 ,2 ]
Ren, Guohao [3 ]
Meng, Fang [1 ,2 ]
Chen, Xiaofeng [3 ]
Ding, Dongzhou [3 ]
Li, Huanyin [3 ]
Pan, Shangke [3 ]
Melcher, Charles L. [1 ,2 ]
机构
[1] Univ Tennessee, Scintillat Mat Res Ctr, Knoxville, TN 37996 USA
[2] Univ Tennessee, Dept Mat Sci & Engn, Knoxville, TN 37996 USA
[3] Chinese Acad Sci, R&D Ctr Synthet Crystal, Shanghai Inst Ceram, Shanghai 201899, Peoples R China
基金
中国国家自然科学基金;
关键词
Afterglow; CsI:In; energy resolution; non-proportionality; LUMINESCENCE PROPERTIES; GROWTH; EU2+; SUPPRESSION; AFTERGLOW; TL;
D O I
10.1109/TNS.2015.2412523
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Indium doped cesium iodide (CsI:In) single crystals were grown by the Bridgman method. A comparison study of the scintillation properties of our CsI: In and commercially available CsI:Tl single crystals was carried out, including scintillation decay time, energy resolution, non-proportionality, absolute light yield, and afterglow. Under X-ray excitation, the CsI: In emission corresponds to a symmetrical broad band centered at 545 nm. Its scintillation decay time is 1.99 +/- 0.02 mu s at room temperature under Cs-137 gamma-ray excitation. The CsI: In light yield was found to be 34, 700 +/- 1735 photons per MeV with an energy resolution of 9.1 +/- 0.3%, based on the pulse height spectra under Cs-137 excitation. The afterglow level of CsI:In over 130 ms after pulsed X-ray excitation was two orders of magnitude higher than that of CsI:Tl.
引用
收藏
页码:571 / 576
页数:6
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