Surface Tension of Micellar Block Copolymer Films

被引：1
|
作者：
Lee, Heeju [1 ]
Li, Xiaolong [1 ]
Kim, Hyunjung [1 ]
Jiang, Zhang [2 ]
Lim, Jung-Ran [3 ]
Lee, Jouhahn [3 ]
机构：
[1] Sogang Univ, Dept Phys, Seoul 121742, South Korea
[2] Argonne Natl Lab, Adv Photon Source, Xray Sci Div, Argonne, IL 60439 USA
[3] Jeonju Ctr, Korea Basic Sci Inst, Jeonju 561756, South Korea
来源：
JOURNAL OF THE KOREAN PHYSICAL SOCIETY | 2010年 / 57卷 / 06期
基金：
新加坡国家研究基金会;
关键词：
Surface tension; Polymer surface; X-ray diffuse scattering; Angle-resolved X-ray photoelectron spectroscopy; X-RAY; NEUTRON;
D O I：
10.3938/jkps.57.1412
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Surface tensions of micellar block copolymers of poly(styrene-b-dimethylsiloxane) (PS-b-PDMS) films are obtained by X-ray diffuse scattering. PS-b-PDMS films on Si substrates with the thicknesses from 36 to 588 nm were investigated at temperatures of 30 - 215 degrees C. The surface tension reflects the concentration of PDMS micelles which are preferably located at the surface. The molar fraction of PDMS micelles near the surface is estimated by using angle-resolved X-ray photoelectron spectroscopy.
引用
收藏
页码：1412 / 1415
页数：4
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