Ultrahigh Accurate 3-D Profilometer

被引:43
|
作者
Tsutsumi, H [1 ]
Yoshizumi, K [1 ]
Takeuchi, H [1 ]
机构
[1] Matsushita Elect Ind Co Ltd, Kadoma, Osaka 571, Japan
关键词
ultrahigh accurate 3-D profilometer; atomic force probe; 3-D measurement; aspeheric lens; lens for optical disc; blu-ray disc; free form; user-specific design formulae;
D O I
10.1117/12.573774
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have developed an Ultrahigh-Accurate 3-D Profilometer (UA3P)[1], which, using a new, in-house-developed atomic force probe, has an accuracy of 10 nm. It is capable of measuring corners as small as 2 micro meter in radius and can cover an area up to 400 x 400 x 90 (mm), providing a powerful boost to nano-level processing. A commercial product was introduced in 1994. Examples of the key components made possible by this technology include aspherical lenses (used for a Blu-ray Disc device, a next- generation DVD, digital cameras, cellular phones, optical corrimunications), free form lenses (used for frennel lens common to CD and DVD, laser printer lens, multi focus glass lens, cubic phase plate to extend depth of focus), gigabit semiconductor wafers, hard discs, air conditioner scroll vanes, DVC cylinders. The premiere ultra high-precision three-dimensional profilometer delivers superb performance using a variety of micro-measurements for a wide range of applications.
引用
收藏
页码:387 / 394
页数:8
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