Ultrahigh Accurate 3-D Profilometer

被引:43
|
作者
Tsutsumi, H [1 ]
Yoshizumi, K [1 ]
Takeuchi, H [1 ]
机构
[1] Matsushita Elect Ind Co Ltd, Kadoma, Osaka 571, Japan
关键词
ultrahigh accurate 3-D profilometer; atomic force probe; 3-D measurement; aspeheric lens; lens for optical disc; blu-ray disc; free form; user-specific design formulae;
D O I
10.1117/12.573774
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have developed an Ultrahigh-Accurate 3-D Profilometer (UA3P)[1], which, using a new, in-house-developed atomic force probe, has an accuracy of 10 nm. It is capable of measuring corners as small as 2 micro meter in radius and can cover an area up to 400 x 400 x 90 (mm), providing a powerful boost to nano-level processing. A commercial product was introduced in 1994. Examples of the key components made possible by this technology include aspherical lenses (used for a Blu-ray Disc device, a next- generation DVD, digital cameras, cellular phones, optical corrimunications), free form lenses (used for frennel lens common to CD and DVD, laser printer lens, multi focus glass lens, cubic phase plate to extend depth of focus), gigabit semiconductor wafers, hard discs, air conditioner scroll vanes, DVC cylinders. The premiere ultra high-precision three-dimensional profilometer delivers superb performance using a variety of micro-measurements for a wide range of applications.
引用
收藏
页码:387 / 394
页数:8
相关论文
共 50 条
  • [1] ULTRAHIGH ACCURACY 3-D PROFILOMETER
    YOSHIZUMI, K
    MURAO, T
    MASUI, J
    IMANAKA, R
    OKINO, Y
    APPLIED OPTICS, 1987, 26 (09): : 1647 - 1653
  • [2] Measurement of aspherical and free-form mirror using ultrahigh accurate 3-D profilometer (UA3P)
    Handa, Koji
    Sakuma, Tatsuya
    Sugino, Akihiko
    Kobayashi, Kazumi
    Shibutani, Toshio
    ADVANCES IN X-RAY/EUV OPTICS AND COMPONENTS XIX, 2024, 13150
  • [3] Large-scale 3-D profilometer
    Lan, Yu-Ying
    Chen, Jin-Liang
    Wang, Wei-Cheng
    Chang, Leh-Rong
    APPLICATIONS OF DIGITAL IMAGE PROCESSING XXXI, 2008, 7073
  • [4] Photorefractive Fourier transform profilometer for the measurement of 3-D object shapes
    de Oliveira, G. N.
    de Oliveira, M. E.
    dos Santos, P. A. M.
    OPTICS COMMUNICATIONS, 2012, 285 (24) : 4906 - 4910
  • [5] FAST PROFILOMETER FOR THE AUTOMATIC-MEASUREMENT OF 3-D OBJECT SHAPES
    TANG, S
    HUNG, YY
    APPLIED OPTICS, 1990, 29 (20): : 3012 - 3018
  • [6] Miniaturized 3-D surface profilometer using a fiber optic coupler
    Pennington, TL
    Xiao, H
    May, R
    Wang, AB
    OPTICS AND LASER TECHNOLOGY, 2001, 33 (05): : 313 - 320
  • [7] Easy, accurate 3-D imaging
    不详
    INTECH, 1998, 45 (08) : 34 - 34
  • [8] Accurate inversion of 3-D transformation fields
    Noblet, Vincent
    Heinrich, Christian
    Heitz, Fabrice
    Armspach, Jean-Paul
    IEEE TRANSACTIONS ON IMAGE PROCESSING, 2008, 17 (10) : 1963 - 1968
  • [9] Robust profilometer for the measurement of 3-D object shapes based on a regularized phase tracker
    Villa, J
    Servin, M
    OPTICS AND LASERS IN ENGINEERING, 1999, 31 (04) : 279 - 288
  • [10] A dynamic 3-D surface profilometer with nanoscale measurement resolution and MHz bandwidth for MEMS characterization
    Chen, Liang-Chia
    Huang, Yao-Ting
    Fan, Kuang-Chao
    IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2007, 12 (03) : 299 - 307