Nanoelectromechanical (NEM) Devices for Logic and Memory Applications

被引:0
|
作者
Kwon, Hyug Su [1 ]
Choi, Woo Young [1 ]
机构
[1] Seoul Natl Univ, Dept Elect & Comp Engn, 1 Gwanak Ro, Seoul 08826, South Korea
关键词
CMOS; nanoelectromechanical (NEM)  memory switch; monolithic three-dimensional (M3D)  integration; field programmable gate array (FPGA); NONVOLATILE; DESIGN;
D O I
10.5573/JSTS.2022.22.3.188
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
research on NEM devices for logic and memory applications has been reviewed from the perspective of monolithic 3D (M3D) heterogeneous integration. In addition, the backgrounds of M3D CMOS-NEM reconfigurable logic (RL) circuits are described in detail. Moreover, 65-nm process based M3D CMOS-NEM RL circuits were proposed. It is predicted that proposed M3D CMOS-NEM RL circuits will exhibit 4.6x higher chip density, 2.3x higher operation frequency and 9.3x lower power consumption than CMOS-only ones (tri-state buffer case) for tile-to-tile operation.
引用
收藏
页码:188 / 197
页数:10
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