Improving the Testing and Testability of Software Product Lines

被引:0
|
作者
Cabral, Isis [1 ]
Cohen, Myra B. [1 ]
Rothermel, Gregg [1 ]
机构
[1] Univ Nebraska, Dept Comp Sci, Lincoln, NE 68583 USA
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中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Software Product Line (SPL) engineering offers several advantages in the development of families of software products. There is still a need, however, for better understanding of testability issues and for testing techniques that can operate cost-effectively on SPLs. In this paper we consider these testability issues and highlight some differences between optional versus alternative features. We then provide a graph based testing approach called the FIG Basis Path method that selects products and features for testing based on a feature dependency graph. We conduct a case study on several non-trivial SPLs and show that for these subjects, the FIG Basis Path method is as effective as testing all products, but tests no more than 24% of the products in the SPL.
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页码:241 / 255
页数:15
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