In situ high-resolution transmission electron microscopy of dislocation formation and dynamics during the crystallization of amorphous SrTiO3

In situ high-resolution TEM imaging of an ion-milled SrTiO3 sample during annealing at 925 and 940 degrees C is reported. Regions that were amorphized during the ion-milling at room temperature are observed to crystallize, forming low-angle grain boundaries. At the grain boundaries, perfect alpha < 0 0 1 > dislocations and two climb-dissociated alpha/2 < 0 1 1 > dislocations were observed. The experimental observations also include dynamic dislocation phenomena, such as glide, climb, and annihilation. Interestingly, the separation of the two alpha < 2 0 1 > partial dislocations in the low-angle grain boundaries is not constant, but temporarily fluctuates around a mean value of 2 nm. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.