Resistive Switching in All-Printed, Flexible and Hybrid MoS2-PVA Nanocomposite based Memristive Device Fabricated by Reverse Offset

被引:125
|
作者
Rehman, Muhammad Muqeet [1 ]
Siddiqui, Ghayas Uddin [1 ]
Gul, Jahan Zeb [1 ]
Kim, Soo-Wan [1 ]
Lim, Jong Hwan [1 ]
Choi, Kyung Hyun [1 ]
机构
[1] Jeju Natl Univ, Dept Mechatron Engn, Jeju, South Korea
来源
SCIENTIFIC REPORTS | 2016年 / 6卷
基金
新加坡国家研究基金会;
关键词
THIN-FILM; MEMORY; NANOMATERIALS; EXFOLIATION; NANOSHEETS; COMPOSITE; ZNSNO3;
D O I
10.1038/srep36195
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Owing to the increasing interest in the nonvolatile memory devices, resistive switching based on hybrid nanocomposite of a 2D material, molybdenum disulphide (MoS2) and polyvinyl alcohol (PVA) is explored in this work. As a proof of concept, we have demonstrated the fabrication of a memory device with the configuration of PET/Ag/MoS2-PVA/Ag via an all printed, hybrid, and state of the art fabrication approach. Bottom Ag electrodes, active layer of hybrid MoS2-PVA nanocomposite and top Ag electrode are deposited by reverse offset, electrohydrodynamic (EHD) atomization and electrohydrodynamic (EHD) patterning respectively. The fabricated device displayed characteristic bistable, nonvolatile and rewritable resistive switching behavior at a low operating voltage. A decent off/on ratio, high retention time, and large endurance of 1.28 x 10(2), 10(5) sec and 1000 voltage sweeps were recorded respectively. Double logarithmic curve satisfy the trap controlled space charge limited current (TCSCLC) model in high resistance state (HRS) and ohmic model in low resistance state (LRS). Bendability test at various bending diameters (50-2 mm) for 1500 cycles was carried out to show the mechanical robustness of fabricated device.
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页数:10
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