Low- versus Mid-frequency Raman Spectroscopy for in Situ Analysis of Crystallization in Slurries

Slurry studies are useful for exhaustive polymorph and solid-state stability screening of drug compounds. Raman spectroscopy is convenient for monitoring crystallization in such slurries, as the measurements can be performed in situ even in aqueous environments. While the mid-frequency region (400-4000 cm(-1)) is dominated by intramolecular vibrations and has traditionally been used for such studies, the low-frequency spectral region (<200 cm(-1)) probes solid-state related lattice vibrations and is potentially more valuable for understanding subtle and/or complex crystallization behavior. The aim of the study was to investigate low-frequency Raman spectroscopy for in situ monitoring of crystallization of an amorphous pharmaceutical in slurries for the first time and directly compare the results with those simultaneously obtained with mid-frequency Raman spectroscopy. Amorphous indomethacin (IND) slurries were prepared at pH 1.2 and continuously monitored in situ at 5 and 25 degrees C with both lowand mid-frequency Raman spectroscopy. At 25 degrees C, both spectral regions profiled amorphous IND in slurries as converting directly from the amorphous form toward the a crystalline form. In contrast, at 5 degrees C, principal component analysis revealed a divergence in the detected conversion profiles: the mid-frequency Raman suggested a direct conversion to the alpha crystalline form, but the lowfrequency region showed additional transition points. These were attributed to the appearance of minor amounts of the epsilon-form. The additional solid-state sensitivity of the low-frequency region was attributed to the better signal-to-noise ratio and more consistent spectra in this region. Finally, the low-frequency Raman spectrum of the epsilon-form of IND is reported for the first time.