Leakage mechanisms of sol-gel derived multiferroic Bi5Ti3FeO15 thin films of layered perovskite

被引:5
|
作者
Li, Jin [1 ,2 ]
Luo, Li [1 ,2 ]
Feng, Linyan [1 ,2 ]
Liang, Kaili [1 ,2 ]
Su, Jie [1 ,2 ,3 ,4 ]
Lu, Chaojing [1 ,2 ]
机构
[1] Qingdao Univ, Univ Shandong, Coll Phys Sci, Qingdao 266071, Peoples R China
[2] Qingdao Univ, Univ Shandong, Key Lab Photon Mat & Technol, Qingdao 266071, Peoples R China
[3] Qingdao Univ, Sch Elect & Informat Engn, Qingdao 266071, Peoples R China
[4] Nanjing Univ, Phys Dept, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China
基金
中国博士后科学基金; 美国国家科学基金会;
关键词
BI5FETI3O15; TITANATE; BIFEO3; OXIDE;
D O I
10.1007/s10854-018-9690-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Polycrystalline Bi5Ti3FeO15 (BTFO) thin films of layered perovskite are prepared on (111)Pt/Ti/SiO2/Si via a sol-gel route. The BTFO thin films exhibit room-temperature multiferroic properties with the remanent polarization (2P (r)) of 56 A mu C/cm(2) and saturated magnetization (M (s)) of 0.45 emu/cm(3). Their leakage current characteristics are investigated at different temperatures from 53 to 293 K. Their leakage currents are found to be dominantly controlled by space charge limited current under low electric fields and Poole-Frenkel emission at high electric fields. Their zero-field trap ionization energy is determined to be 0.196 eV, suggesting the existence of shallow traps in the BTFO films.
引用
收藏
页码:16027 / 16031
页数:5
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