Research on the system of photoelectric auto-measuring for internal diameter

被引：0
|
作者：
Song, T [1 ]
Lin, XY [1 ]
机构：
[1] Jilin Engn Coll, Changchun 130024, Peoples R China
来源：
AUTOMATED OPTICAL INSPECTION FOR INDUSTRY: THEORY, TECHNOLOGY, AND APPLICATIONS II | 1998年 / 3558卷
关键词：
charge coupled device (CCD); single-chip microcomputer; detecting;
D O I：
10.1117/12.318393
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This paper discussed the system of a photoelectric auto-measuring which is used to measuring size of the internal diameter. In this system include the Charge Coupled Devices CCD measuring unit, signal processing unit and micro computer controlling unit, to realize non-contact measurement. Paper gives structure and principle of the system, specially gives the method of increasing stability of system.
引用
收藏
页码：244 / 247
页数：4
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