Electron Microscopy Studies of Electron-Beam Sensitive PbTe-Based Nanostructures

被引:3
|
作者
Falqui, Andrea [1 ]
Bertoni, Giovanni [1 ]
Genovese, Alessandro [1 ]
Marras, Sergio [1 ]
Malerba, Mario [1 ]
Franchini, Isabella R. [1 ,2 ]
Manna, Liberato [1 ]
机构
[1] Ist Italiano Tecnol, I-16163 Genoa, Italy
[2] CNR INFM, Natl Nanotechnol Lab, I-73100 Lecce, Italy
关键词
Cs-corrected high resolution transmission electron microscopy; PbTe; quantum dots; scanning transmission electron microscopy; energy-dispersive x-ray spectrometry; DIFFUSION; OXIDE; SEMICONDUCTORS; REDUCTION; NANOWIRES; GROWTH;
D O I
10.1002/jemt.20843
中图分类号
R602 [外科病理学、解剖学]; R32 [人体形态学];
学科分类号
100101 ;
摘要
PbTe nanocrystals were synthesized and then reacted with a toluene solution containing AuCl3. Depending on the reaction conditions and on the starting PbTe nanocrystals morphology, different kinds of nanostructures have been obtained: single defect-free PbTe nanocrystals with and without an external amourphous oxide shell, crystalline-Au core/amorphous PbxTeyAu, shell structure, large balloon-shaped (or mushroom-shaped) Au domain attached via its apex to the surface of the nanocrystals. Structure and composition of these different types of nanostructure have been studied by means of C-s-corrected High Resolution Transmission Electron Microscopy (HRTEM) and Scanning Transmission Electron Microscopy (STEM) together with Energy Dispersive X-Ray Spectrometry (EDX), respectively. These nanostructures have been found sensitive to the high-intensity electron beam and its effect has been investigated. Microsc. Res. Tech. 73:944-951, 2010. (C) 2010 Wiley-Liss. Inc.
引用
收藏
页码:944 / 951
页数:8
相关论文
共 50 条
  • [31] ELECTRON-MICROSCOPY OF SE-IMPLANTED AND ELECTRON-BEAM ANNEALED GAAS
    SHAH, NJ
    AHMED, H
    FREEMAN, LA
    SMITH, DJ
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1983, (67): : 125 - 130
  • [32] SCANNING ELECTRON-MICROSCOPY AND RELATED ELECTRON-BEAM TECHNIQUES IN IC TECHNOLOGY
    BINDELL, JB
    SOLID STATE TECHNOLOGY, 1975, 18 (04) : 45 - 50
  • [33] ELECTRON-BEAM DAMAGE IN SCANNING ELECTRON-MICROSCOPY OF WORN ELASTOMER SURFACES
    ARNOLD, JC
    HUTCHINGS, IM
    WEAR, 1988, 128 (03) : 339 - 342
  • [34] SOME ASPECTS OF THE EFFECT OF AN ELECTRON-BEAM ON SENSITIVE MATERIAL
    JOUFFREY, B
    JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1983, 8 (02): : A45 - A45
  • [35] A METAL DOPING EFFECT IN AN ELECTRON-BEAM SENSITIVE RESIST
    YAMADA, M
    HATTORI, S
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (10) : 1969 - 1970
  • [36] Electron-beam lithography of nanostructures at the tips of scanning probe cantilevers
    Forrer, L.
    Kamber, A.
    Knoll, A.
    Poggio, M.
    Braakman, F. R.
    AIP ADVANCES, 2023, 13 (03)
  • [37] STUDIES OF A GLOW-DISCHARGE ELECTRON-BEAM
    YU, ZQ
    ROCCA, JJ
    COLLINS, GJ
    JOURNAL OF APPLIED PHYSICS, 1983, 54 (01) : 131 - 136
  • [38] Electron-beam transport studies for radiographic applications
    Hinshelwood, DD
    Ponce, DM
    Mosher, D
    Murphy, DP
    Schumer, JW
    Strasburg, SD
    Weber, BV
    PPC-2003: 14TH IEEE INTERNATIONAL PULSED POWER CONFERENCE, VOLS 1 AND 2, DIGEST OF TECHNICAL PAPERS, 2003, : 491 - 494
  • [39] ELECTRON-BEAM TRANSPORT STUDIES FOR THE APLE EXPERIMENT
    MCVEY, BD
    BROWMAN, MJ
    CARLSTEN, BE
    TAKEDA, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1992, 318 (1-3): : 330 - 334
  • [40] POWER-DENSITY OF ELECTRON-BEAM IN BEAM HOLE OF ELECTRON-BEAM WELDING
    IRIE, H
    HASHIMOTO, T
    INAGAKI, M
    ARATA, Y
    TRANSACTIONS OF NATIONAL RESEARCH INSTITUTE FOR METALS, 1981, 23 (04): : 258 - 264