Synchrotron radiation studies of thin films and implanted layers with the materials research endstation of ROBL

被引：0
|
作者：
Schell, N
Matz, W
Eichhorn, F
Prokert, F
Berberich, F
机构：
[1] Forschungszentrum Rossendorf EV, Project Grp ESRF Beamline, D-01314 Dresden, Germany
[2] Forschungszentrum Rossendorf EV, Inst Ion Beam Phys & Mat Res, D-01314 Dresden, Germany
来源：
JOURNAL OF ALLOYS AND COMPOUNDS | 2001年 / 328卷 / 1-2期
关键词：
synchrotron radiation beamline; X-ray diffraction; reflectometry; thin films; implanted layers;
D O I：
10.1016/S0925-8388(01)01330-5
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The paper describes the possibilities and advantages of the in-house materials research endstation of the Rossendorf Beamline ROBL at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France. Some X-ray diffraction and reflectometry results mainly of thin films and interfaces show the scientific merit and versatility of the instrumentation. (C) 2001 Elsevier Science BV All rights reserved.
引用
收藏
页码：105 / 111
页数：7
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