A self-calibration method for capacitance mismatch in SAR ADC with split-capacitor DAC

被引:4
|
作者
Dai, Peng [1 ]
Zhao, Yiqiang [1 ]
Sheng, Yun [1 ]
Zhang, Yun [1 ]
机构
[1] Tianjin Univ, Sch Elect & Informat Engn, Tianjin 300072, Peoples R China
关键词
Split-DAC; Self-calibration; Capacitance mismatch; Calibration DAC array; ARRAY;
D O I
10.1016/j.mejo.2015.03.011
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A self-calibration method to calibrate the nonlinearity due to capacitance mismatch in successive approximation register (SAR) analog-to-digital converter (ADC) is presented. It focuses on calibrating the most significant bit (MSB) array in the split-capacitor main DAC (split-MDAC) by using a calibration DAC (CDAC) that contains multiple sub-CDACs. Every bit in MSB array has its corresponding sub-CDAC in CDAC, which enhances the calibration efficiency. To verify the calibration method, a 14 bit, 50016/s SAR ADC is implemented, and it is manufactured in 0.35 mu m 2P4M CMOS process. The measured results show that the proposed calibration method can assist this SAR ADC to achieve better static and dynamic performance, and its ENOB is improved from 9 bit to 11.98 bit at Nyquist input frequency. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:431 / 438
页数:8
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