High pressure freezing and cryo-scanning electron microscopy: Technical aspects

被引：0

作者：

Kaech, A ^{[1
]}

机构：

[1] Bal Tec AG, Liechtenstein, FL, Switzerland

来源：

SCANNING | 2005年 / 27卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：62 / 62

页数：1

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