High pressure freezing and cryo-scanning electron microscopy: Technical aspects

被引：0
|
作者：
Kaech, A [1 ]
机构：
[1] Bal Tec AG, Liechtenstein, FL, Switzerland
来源：
SCANNING | 2005年 / 27卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：62 / 62
页数：1
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