Distributed Hardware Matcher Framework for SoC Survivability

被引:0
|
作者
Wagner, Ilya [1 ]
Lu, Shih-Lien [2 ]
机构
[1] Intel Corp, Platform Validat Engn, Santa Clara, CA 95054 USA
[2] Intel Corp, Oregon Microarchitecture Lab, Santa Clara, CA 95051 USA
来源
2011 DESIGN, AUTOMATION & TEST IN EUROPE (DATE) | 2011年
基金
美国国家科学基金会;
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Modern systems on chip (SoCs) are rapidly becoming complex high-performance computational devices, featuring multiple general purpose processor cores and a variety of functional IP blocks, communicating with each other through on-die fabric. While modular SoC design provides power savings and simplifies the development process, it also leaves significant room for a special type of hardware bugs, interaction errors, to slip through pre-and post-silicon verification. Consequently, hard to fix silicon escapes may be discovered late in production schedule or even after a market release, potentially causing costly delays or recalls. In this work we propose a unified error detection and recovery framework that incorporates programmable features into the on-die fabric of an SoC, so triggers of escaped interaction bugs can be detected at runtime. Furthermore, upon detection, our solution locks the interface of an IP for a programmed time period, thus altering interactions between accesses and bypassing the bug in a manner transparent to software. For classes of errors that cannot be circumvented by this in-hardware technique our framework is programmed to propagate the error detection to the software layer. Our experiments demonstrate that the proposed framework is capable of detecting a range of interaction errors with less than 0.01% performance penalty and 0.45% area overhead.
引用
收藏
页码:305 / 310
页数:6
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