Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications

被引：3

作者：

Vernon, Emerson ^{[1
,2
]}

De Geronimo, Gianluigi ^{[2
]}

Baldwin, Jonathan ^{[3
]}

Chen, Wei ^{[1
]}

Fried, Jack ^{[1
]}

Giacomini, Gabriele ^{[1
]}

Kuczewski, Anthony ^{[4
]}

Kuczewski, John ^{[1
]}

Mead, Joe ^{[1
]}

Miceli, Antonino ^{[3
]}

Okasinski, John S. ^{[3
]}

Pinelli, Don ^{[1
]}

Quaranta, Orlando ^{[3
]}

Rumaiz, Abdul K. ^{[4
]}

Siddons, Peter ^{[4
]}

Smith, Graham ^{[1
]}

Stanacevic, Milutin ^{[2
]}

Woods, Russell ^{[3
]}

机构：

[1] Brookhaven Natl Lab, Instrumentat Div, Upton, NY 11973 USA

[2] SUNY Stony Brook, Dept Elect & Comp Engn, Stony Brook, NY 11794 USA

[3] Argonne Natl Lab, Xray Sci Div, Lemont, IL 60439 USA

[4] Brookhaven Natl Lab, NSLS II, Upton, NY 11973 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2020年 / 67卷 / 04期

关键词：

Application-specific integrated circuit (ASIC); detector; diffraction (EDX); front end; mixed signal; spectroscopy (XFS); synchrotron applications; DETECTOR;

D O I：

10.1109/TNS.2020.2976820

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1-mu s peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 e(-) rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an Fe-55 source. The channel linearity was better than +/- 1% with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm x 3.9 mm and dissipates 167 mW of static power.

引用

页码：752 / 759

页数：8

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