Deformation Characteristics of Sn-3Ag-0.5Cu/Cu/Ni-xCu/Ti Joints after Mechanical Test

被引:0
|
作者
Peng, Cung-Nan [1 ]
Duh, Jenq-Gong [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu, Taiwan
关键词
PB-FREE; SN-PB; SOLDER; AU/NI/CU; GROWTH; AG;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In BGA packages and flip-chip packages, a Ni layer is often used in the under bump metallurgy (UBM) to serve as a diffusion barrier. However, unstable phase of Ni3Sn4 compound formed between Ni UBM and Sn-rich solder, leading to a critical spalling issue. To avoid the formation of a (Ni, Cu)(3)Sn-4 interlayer between Ni versus the solder, it is known that to increase Cu concentration in the solder was an effective way for the reactive interface [1-8]. In this study, a systematic design of UBM with Cu/Ni-xCu/Ti (x = 0-20wt.%) were adopted to react with Sn-3Ag-0.5Cu ball (phi = 300 mu m). Multi-reflow altered the morphology of the IMCs formed at the interface. FE-EPMA was used to quantitatively analyze intermetallic compounds and to observe fracture surface. Furthermore, the pull and shear tests were employed to measure the mechanical properties of Sn-3Ag-0.5Cu/Cu/Ni-xCu/Ti joints. It was revealed that the shear strength increased with Cu contents in Ni layer and reflow times. The thickness of (Cu,Ni)(6)Sn-5 IMC affected the shear strength. The shear mode changed from ductile (failure inside the bulk solder) to partially brittle (failure at the solder/IMC or IMC/UBM interfaces) in the Sn-3Ag-0.5Cu/Cu/Ni-xCu/Ti (x = 0-20wt.%) joints with the reflow times up to 5. The result of pull test was different from that of shear test, and force direction of tool was critical. The pull strength increased with the number of reflow times. Although the thickness of (Cu, Ni)(6)Sn-5 increased with reflow times, it was too thin to affect pull strength. The Cu concentration of solder did play a critical role in pull strength. It was argued that the Cu concentration of solder could decrease Sn grain size, leading to the higher pull strength. The similar tread of shear and pull results was also found in Chen's [9] and Lehma's [10] studies. The results of this study suggest that Cu-rich Ni-xCu UBM can be used to suppress interfacial spalling and to improve both shear and pull strength in the solder joint.
引用
收藏
页码:967 / 970
页数:4
相关论文
共 50 条
  • [41] Sn-3Ag-0.5Cu合金与金属Cu的润湿性研究
    刘亚光
    陈磊
    胥晓晨
    张波
    热加工工艺, 2023, 52 (17) : 41 - 43
  • [42] Microstructure and mechanical properties of Sn3Ag0.5Cu3Bi0.05Cr/Cu joints
    Lin, Fei
    Bi, Wenzhen
    Ju, Guokui
    Xie, Shifang
    Wei, Xicheng
    2011 12TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY AND HIGH DENSITY PACKAGING (ICEPT-HDP), 2011, : 395 - 399
  • [43] Grain orientations and failure mechanism of isothermal aged nano Sn-3Ag-0.5Cu/Cu solder joints by microwave hybrid heating and shear mechanical strength
    Zhang, Shuai
    Zhou, Hongzhi
    Ding, Tianran
    Long, Weimin
    Zhong, Sujuan
    Paik, Kyung-Wook
    He, Peng
    Zhang, Shuye
    ENGINEERING FRACTURE MECHANICS, 2024, 298
  • [44] Experiments and simulations of uniaxial ratchetting deformation of Sn-3Ag-0.5Cu and Sn-37Pb solder alloys
    Kobayashi, Takuji
    Sasaki, Katsuhiko
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2009, 20 (04) : 343 - 353
  • [45] Combined effect of Bi and Ni elements on the mechanical properties of low-Ag Cu/Sn-0.7Ag-0.5Cu/Cu solder joints
    Kong, Xiangxia
    Zhai, Junjun
    Sun, Fenglian
    Liu, Yang
    Zhang, Hao
    MICROELECTRONICS RELIABILITY, 2020, 107
  • [46] Effects of cobalt on the nucleation and grain refinement of Sn-3Ag-0.5Cu solders
    Ma, Z. L.
    Belyakov, S. A.
    Gourlay, C. M.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2016, 682 : 326 - 337
  • [47] Dendrite Growth in Single-Grain and Cyclic-Twinned Sn-3Ag-0.5Cu Solder Joints
    Sun, S.
    Gourlay, C. M.
    METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2024, 55 (11): : 4342 - 4353
  • [48] Interfacial microstructure and bonding strength of Sn-3Ag-0.5Cu and Sn-3Ag-0.5Cu-0.5Ce-xZn solder BGA packages with immersion Ag surface finish
    Lin, Hsiu-Jen
    Chuang, Tung-Han
    MICROELECTRONICS RELIABILITY, 2011, 51 (02) : 445 - 452
  • [49] The effect of high magnetic field on the growth behavior of Sn-3Ag-0.5Cu/Cu IMC layer
    Zhao, J
    Yang, P
    Zhu, F
    Cheng, CQ
    SCRIPTA MATERIALIA, 2006, 54 (06) : 1077 - 1080
  • [50] Influences of intermetallic compounds morphologies on fracture behaviors of Sn-3Ag-0.5Cu/Cu solder joint
    Yang, L. M.
    Zhang, Z. F.
    2013 14TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2013, : 247 - 249