Impedance spectroscopy of Au/TiO2/n-Si metal-insulator-semiconductor (MIS) capacitor

被引:16
|
作者
Buyukbas-Ulusan, A. [1 ]
Tataroglu, A. [1 ]
机构
[1] Gazi Univ, Fac Sci, Dept Phys, Ankara, Turkey
关键词
MIS-Capacitor device; Titanium oxide; Impedance spectroscopy; Cole-cole plot; ELECTRICAL CHARACTERISTICS; TIO2; FILMS; THIN-FILMS; TRANSPORT-PROPERTIES; ANATASE;
D O I
10.1016/j.physb.2019.411945
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
In this study, the electrical properties of Au/TiO2/n-Si metal-insulator-semiconductor (MIS) capacitor were investigated by impedance spectroscopy (IS) technique. Impedance measurements were performed in the frequency range of 10 Hz-1 MHz for various bias voltages. The Cole-Cole plots show a single dielectric relaxation. The equivalent circuit was estimated from the shape of the Cole-Cole plots. The equivalent circuit of the MIS capacitor consists of a parallel resistor (R-p) and capacitor (C-p) in series with a resistor (R-s). It is observed that the Cole-Cole plots indicate a semicircle. The parameters of the equivalent circuit were determined by fitting the impedance measurement data. While the R-p value decreases with increasing the bias voltage, the C-p and R-s value are almost independent of the bias voltage. From the variation of log(R-p) with log(V), the dominant conduction mechanism of the MIS capacitor was determined as space-charge limited current (SCLC) mechanism.
引用
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页数:4
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