Statistical methods, such as Principal component thermography (PCT) and Sparse Principal component thermography (SPCT) have been widely used for signal enhancement of subsurface defects in pulsed thermographic (PT) detection of composite materials. However, PCT and SPCT mainly focus on the temporal variation of thermographic data while leaving the structural variation un-modeled. In this paper, a method of sparse structural principal component thermography ((SPCT)-P-2) is proposed. In (SPCT)-P-2, the operation of shift-sampling is first conducted to augment the original thermographic matrix and capture the structural relationships inside the original thermal images. After that, the sparse trick is applied to extract features for defects and reduce signals of noise and non-uniform background. In the case study, two carbon fiber reinforced polymer (CFRP) specimens are detected with PT and the proposed (SPCT)-P-2 is evaluated for visualization enhancing purpose. The results of the experiments have revealed the proposed method helps to highlight the defect signals during the augmentation process, thus showing higher flexibility in reducing interference from background signals. As a conclusion, compared to the original statistical methods, (SPCT)-P-2 has better performance in visualization enhancing of defects.
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Univ Valle, Escuela Ingn Elect & Elect, Cali 760032, VA, Colombia
Inst Univ Antonio Jose Camacho, Fac Ingn, Cali 760046, VA, ColombiaUniv Valle, Escuela Ingn Elect & Elect, Cali 760032, VA, Colombia
Erazo-Aux, Jorge
Loaiza-Correa, Humberto
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Univ Valle, Escuela Ingn Elect & Elect, Cali 760032, VA, ColombiaUniv Valle, Escuela Ingn Elect & Elect, Cali 760032, VA, Colombia
Loaiza-Correa, Humberto
David Restrepo-Giron, Andres
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Univ Valle, Escuela Ingn Elect & Elect, Cali 760032, VA, ColombiaUniv Valle, Escuela Ingn Elect & Elect, Cali 760032, VA, Colombia
David Restrepo-Giron, Andres
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Ibarra-Castanedo, Clemente
Maldague, Xavier
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Laval Univ, Comp Vis & Syst Lab, Quebec City, PQ G1V 0A6, CanadaUniv Valle, Escuela Ingn Elect & Elect, Cali 760032, VA, Colombia
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Tsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R ChinaTsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R China
Tu, Yanxin
Cao, Bin
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Tsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R ChinaTsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R China
Cao, Bin
Jiang, Zhuojun
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Tsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R ChinaTsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R China
Jiang, Zhuojun
Liu, Lishuai
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East China Univ Sci & Technol, Sch Mech & Power Engn, Shanghai Key Lab Intelligent Sensing & Detect Tech, Shanghai 200237, Peoples R ChinaTsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R China
Liu, Lishuai
Mei, Hongwei
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Tsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R ChinaTsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R China
Mei, Hongwei
Wang, Liming
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Tsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R ChinaTsinghua Univ, Shenzhen Int Grad Sch, Shenzhen 518055, Peoples R China