Digital microscopy from nano to macro, using the SIAMS image-analysis system

被引：0
|
作者：
Kadushnikov, R. M. [1 ]
Alievskii, V. M. [1 ]
Somina, S. V. [1 ]
Kozerchuk, A. L. [1 ]
Petrov, M. S. [1 ]
机构：
[1] OOO SIAMS, Ekaterinburg, Russia
来源：
JOURNAL OF OPTICAL TECHNOLOGY | 2011年 / 78卷 / 01期
关键词：
D O I：
10.1364/JOT.78.000061
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
This article discusses the key features of new image-analysis systems, based on electronic-table technology for working with images. It is shown that image-analysis systems can be transformed from the category of visualization systems into the category of measurement facilities. Examples are given of the operation of the SIAMS image analyzer for analyzing the images of microstructures in a wide range of scales, obtained by various methods of digital microscopy. (C) 2011 Optical Society of America.
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页码：61 / 65
页数：5
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