Total Dose Induced Bias Current Variation in the LM124 operational amplifier with Different Bias

被引：0
|
作者：
Liu Jian-Bo [1 ,2 ]
Liu Yuan [1 ,2 ]
En Yun-Fei [2 ]
Yang Yuan-Zheng [1 ]
He Yu-Juan [2 ]
Shi Qian [2 ]
机构：
[1] Guangdong Univ Technol, Guangzhou, Guangdong, Peoples R China
[2] Sci & Technol Reliabil Phys & Applicat Elect Comp, Guangzhou, Guangdong, Peoples R China
来源：
2013 IEEE INTERNATIONAL CONFERENCE OF ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC) | 2013年
关键词：
operational amplifier; total dose; bias current; interface state; fixed charge; BIPOLAR-DEVICES; DEGRADATION; CIRCUITS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Total dose dependence of bias current in the linear operational amplifier LM124 with different bias are presented. The experimental results show that the bias currents in the LM124 with powered bias are significant affected by oxide trapped charges; furthermore, the bias currents in the low dose rate are more affected by the interface state near Si/SiO2. These results can be used for design and hardness assurance.
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页数：2
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