Four-valued memory circuit designed by multiple-peak MOS-NDR devices and circuits

被引:0
|
作者
Liang, DS
Gan, KJ
Su, LX
Chen, CP
Hsiao, CC
Tsai, CS
Chen, YH
Wang, SY
Kuo, SH
Chiang, FC
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TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper describes the design of a four-valued memory cell based on a three-peak MOS-NDR circuit. We connect three MOS-NDR devices in parallel that can create a three-peak current-voltage curve by suitably arranging the parameters. Due to its folding I-V characteristics, multiple -peak NDR device is a very promising device for multiple -valued logic application. This memory cell structure can be easily extended to implement more states in a memory circuit.
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页码:78 / 81
页数:4
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