Performance and limitations of AlGaN/GaN HFETs grown on sapphire and SiC substrates

被引:4
|
作者
Vescan, A [1 ]
Dietrich, R [1 ]
Wieszt, A [1 ]
Lee, JS [1 ]
Schurr, A [1 ]
Leier, H [1 ]
Daumiller, I [1 ]
Käb, N [1 ]
Kohn, E [1 ]
机构
[1] DaimlerChrysler AG, Res & Technol, D-89013 Ulm, Germany
关键词
D O I
10.1109/CORNEL.2000.902546
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:247 / 256
页数:10
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