Polysaccharide properties probed with atomic force microscopy

被引:104
|
作者
Abu-Lail, NI [1 ]
Camesano, TA [1 ]
机构
[1] Worcester Polytech Inst, Dept Chem Engn, Worcester, MA 01609 USA
关键词
AFM; atomic force microscopy; polysaccharide; single-molecule force spectroscopy;
D O I
10.1111/j.1365-2818.2003.01261.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
In recent years, polysaccharides have been extensively studied using atomic force microscopy (AFM). Owing to its high lateral and vertical resolutions and ability to measure interaction forces in liquids at pico- or nano-Newton level, the AFM is an excellent tool for characterizing biopolymers. The first imaging studies showed the morphology of polysaccharides, but gradually more quantitative image analysis techniques were developed as the AFM grew easier to use in aqueous liquids and in non-contact modes. Recently, AFM has been used to stretch polysaccharides and characterize their physicochemical properties by application of appropriate polymer stretching models, using a technique called single-molecule force spectroscopy. From application of such models as the wormlike chain, freely jointed chain, extensible-freely jointed chain, etc., properties such as the contour length, persistence length and segment elasticity or spring constant can be calculated for polysaccharides. The adhesion between polysaccharides and surfaces has been quantified with AFM, and this application is particularly useful for studying polysaccharides on microbial and other types of cells, because their adhesion is controlled by biopolymer characteristics. This review presents a synthesis of the theory and techniques currently in use to probe the physicochemical properties of polysaccharides with AFM.
引用
收藏
页码:217 / 238
页数:22
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