Bending Properties of Single Functionalized Graphene Sheets Probed by Atomic Force Microscopy

被引:179
|
作者
Schniepp, Hannes C. [1 ]
Kudin, Konstantin N. [2 ]
Li, Je-Luen [2 ]
Prud'homme, Robert K. [1 ]
Car, Roberto [2 ]
Saville, Dudley A. [1 ]
Aksay, Ilhan A. [1 ]
机构
[1] Princeton Univ, Dept Chem Engn, Princeton, NJ 08544 USA
[2] Princeton Univ, Dept Chem, Princeton, NJ 08544 USA
基金
美国国家科学基金会;
关键词
graphene; nanocomposites; mechanical properties; bending modulus; atomic force microscopy; density functional theory;
D O I
10.1021/nn800457s
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We probe the bending characteristics of functionalized graphene sheets with the tip of an atomic force microscope. Individual sheets are transformed from a flat into a folded configuration. Sheets can be reversibly folded and unfolded multiple times, and the folding always occurs at the same location. This observation suggests that the folding and bending behavior of the sheets is dominated by pre-existing kink (or even fault) lines consisting of defects and/or functional groups.
引用
收藏
页码:2577 / 2584
页数:8
相关论文
共 50 条
  • [1] Polysaccharide properties probed with atomic force microscopy
    Abu-Lail, NI
    Camesano, TA
    [J]. JOURNAL OF MICROSCOPY, 2003, 212 : 217 - 238
  • [2] Effects of methotrexate on the viscoelastic properties of single cells probed by atomic force microscopy
    Mi Li
    Lianqing Liu
    Xiubin Xiao
    Ning Xi
    Yuechao Wang
    [J]. Journal of Biological Physics, 2016, 42 : 551 - 569
  • [3] Effects of methotrexate on the viscoelastic properties of single cells probed by atomic force microscopy
    Li, Mi
    Liu, Lianqing
    Xiao, Xiubin
    Xi, Ning
    Wang, Yuechao
    [J]. JOURNAL OF BIOLOGICAL PHYSICS, 2016, 42 (04) : 551 - 569
  • [4] Wear properties of graphene edges probed by atomic force microscopy based lateral manipulation
    Vasic, Borislav
    Matkovic, Aleksandar
    Gajic, Rados
    Stankovic, Igor
    [J]. CARBON, 2016, 107 : 723 - 732
  • [5] Electronic properties of epitaxial graphene residing on SiC facets probed by conductive atomic force microscopy
    Giannazzo, F.
    Deretzis, I.
    Nicotra, G.
    Fisichella, G.
    Spinella, C.
    Roccaforte, F.
    La Magna, A.
    [J]. APPLIED SURFACE SCIENCE, 2014, 291 : 53 - 57
  • [6] Adhesive properties of Staphylococcus epidermidis probed by atomic force microscopy
    Hu, Yifan
    Ulstrup, Jens
    Zhang, Jingdong
    Molin, Soren
    Dupres, Vincent
    [J]. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2011, 13 (21) : 9995 - 10003
  • [7] Elastic properties of epithelial cells probed by atomic force microscopy
    Bruckner, Bastian R.
    Janshoff, Andreas
    [J]. BIOCHIMICA ET BIOPHYSICA ACTA-MOLECULAR CELL RESEARCH, 2015, 1853 (11): : 3075 - 3082
  • [8] Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy
    Yan, Liang
    Punckt, Christian
    Aksay, Ilhan A.
    Mertin, Wolfgang
    Bacher, Gerd
    [J]. PHYSICS OF SEMICONDUCTORS: 30TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF SEMICONDUCTORS, 2011, 1399
  • [9] Single Molecules and Networks of Xanthan Gum Probed by Atomic Force Microscopy
    Ikeda, Shinya
    Gohtani, Shoichi
    Nishinari, Katsuyoshi
    Zhong, Qixin
    [J]. FOOD SCIENCE AND TECHNOLOGY RESEARCH, 2012, 18 (05) : 741 - 745
  • [10] Nanomechanical properties of lithiated Si nanowires probed with atomic force microscopy
    Lee, Hyunsoo
    Shin, Weonho
    Choi, Jang Wook
    Park, Jeong Young
    [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2012, 45 (27)