Concurrent spinodal decomposition and surface roughening in thin solid films

被引：8
|
作者：
Boyne, A. [1 ]
Dregia, S. A. [1 ]
Wang, Y. [1 ]
机构：
[1] Ohio State Univ, Dept Mat Sci & Engn, Columbus, OH 43210 USA
来源：
APPLIED PHYSICS LETTERS | 2011年 / 99卷 / 06期
基金：
美国国家科学基金会;
关键词：
PHASE-FIELD MODEL; AG; INSTABILITIES; MORPHOLOGY; SIMULATION; INTERFACE;
D O I：
10.1063/1.3624532
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A computational model based on the phase field method is developed to investigate the morphological evolution of a thin solid film undergoing concurrent spinodal decomposition and surface roughening. It is found that there is a strong link between developing two-phase microstructures, surface roughness, and film break-up. A non-traditional film-to-island morphological transition is observed due to the presence of coherency stress in the film caused by phase separation. (C) 2011 American Institute of Physics. [doi:10.1063/1.3624532]
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页数：3
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