Near-field enhancements and surface plasmon polaritons with multifunctional oxide thin films

被引:2
|
作者
Dab, Chahinez [1 ]
Thomas, Reji [2 ]
Hajlaoui, Thameur [1 ]
Ruediger, Andreas [1 ,3 ]
机构
[1] INRS, EMT, Ctr Energie & Mat, Nanophoton Nanoelect, 1650 Boul Lionel Boulet, Varennes, PQ J3X 1S2, Canada
[2] Lovely Profess Univ, Div Res & Dev, Phagwara, Punjab, India
[3] Univ Sherbrooke, Dept Elect Engn & Informat Technol, Sherbrooke, PQ, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
enhancement factor; finite element method (FEM); interface multifunctional oxide film/metal; surface plasmon polaritons (SPPs); tip-enhanced Raman spectroscopy; RAMAN-SPECTROSCOPY; OPTICAL-PROPERTIES; REFRACTIVE-INDEX; DEPENDENCE; RESONANCE; SENSOR; TERS;
D O I
10.1002/jrs.5473
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The thickness of multifunctional oxide films directly affects the localized enhancement of the electromagnetic field and hence is a key factor for realizing novel photonic or optoelectronic devices. To this end, we theoretically exploit the principle of tip-enhanced Raman spectroscopy on the surface of multifunctional oxide films (bismuth ferrite and barium titanate) on a gold substrate. An electromagnetic field enhancement of up to 10(4) in close proximity of the tip apex was obtained. The good agreement between simulation and experiment of spatial resolution of the tip supports the validity of our model. By investigation of surface plasmon polaritons that propagates at the interface between the multifunctional film and the gold substrate, we demonstrated a thickness dependent propagation length and amplitude. This study indicates a critical thickness of the films above which neither a considerable near-field nor a tip-mediated excitation are observed. This confirms the validity, promise, and power of tip-enhanced Raman spectroscopy technique for the analysis of various electro-optic materials.
引用
收藏
页码:1911 / 1919
页数:9
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