A new testing technology and its applications

被引：0
|
作者：
Hunting, CJ [1 ]
机构：
[1] ConnectorTest Int, Pasadena, CA 91107 USA
来源：
CONNECTOR SPECIFIER | 1998年 / 14卷 / 09期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：10 / 12
页数：3
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