The origin of sample memory in the Chalk River accelerator mass spectrometry sputter ion source

被引：3
|
作者：
Koslowsky, VT
Andrews, HR
Davies, WG
Forster, JS
Imahori, Y
机构：
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1996年 / 67卷 / 03期
关键词：
D O I：
10.1063/1.1146683
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The origin of memory effects in the Chalk River accelerator mass spectrometry sputter ion source has been studied by tracer and elastic-recoil-detection surface analysis techniques. For Cl-36 measurements, the results indicate that the memory arises from contamination of the region immediately surrounding the sample and that it can be mitigated by operating this portion of the ion source above 350 degrees C. This has reduced memory effects by a factor of 10 or more and has resulted in a similar improvement in background. (C) 1996 American Institute of Physics.
引用
收藏
页码：1416 / 1418
页数：3
相关论文
共 50 条
  • [41] Simplifying the ion source for mass spectrometry
    Lu, I-Chung
    Pophristic, Milan
    Inutan, Ellen D.
    McKay, Richard G.
    McEwen, Charles N.
    Trimpin, Sarah
    RAPID COMMUNICATIONS IN MASS SPECTROMETRY, 2016, 30 (23) : 2568 - 2572
  • [42] Test of negative ion beams from a microwave ion source with a charge exchange canal for accelerator mass spectrometry applications
    Kim, SW
    Schneider, RJ
    von Reden, KF
    Hayes, JM
    Wills, JSC
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2002, 73 (02): : 846 - 848
  • [43] STUDY OF AMORPHOUS AND CRYSTALLINE SILICON THIN-FILMS BY SPUTTER-ION SOURCE-MASS SPECTROMETRY
    FELDMAN, C
    SATKIEWICZ, FG
    THIN SOLID FILMS, 1972, 12 (02) : 217 - +
  • [44] Development of a compact cesium-seeded magnetically confined plasma ion source for accelerator mass spectrometry
    Tumey, SJ
    Mignerey, AC
    Grabowski, KS
    Knies, DL
    Leonhardt, D
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (05): : 1910 - 1912
  • [45] EMITTANCE MEASUREMENTS OF HEAVY-ION BEAMS FROM CHALK RIVER MP TANDEM ACCELERATOR
    FORSTER, JS
    ALEXANDER, TK
    BURN, N
    BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1975, 20 (04): : 563 - 563
  • [46] DEVELOPMENT OF AN ION MICROPROBE STAGE FOR ACCELERATOR MASS SPECTROMETRY.
    Wilson, G.C.
    Rucklidge, J.C.
    Kieser, W.E.
    Beukens, R.P.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1984, 233
  • [47] Neutral injection for radioactive ion beams and accelerator mass spectrometry
    Litherland, AE
    Purser, KH
    Gove, HE
    HEAVY ION ACCELERATOR TECHNOLOGY, 1999, 473 : 426 - 436
  • [48] DEVELOPMENT OF AN ION MICROPROBE STAGE FOR ACCELERATOR MASS-SPECTROMETRY
    WILSON, GC
    RUCKLIDGE, JC
    KIESER, WE
    BEUKENS, RP
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 5 (02): : 200 - 203
  • [49] A multi-sample Cs-sputter negative-ion source
    Alton, GD
    Cui, B
    Bao, Y
    Reed, CA
    Ball, JA
    Williams, C
    HEAVY ION ACCELERATOR TECHNOLOGY, 1999, 473 : 352 - 359
  • [50] A MULTIPLE-SAMPLE, CESIUM-SPUTTER, NEGATIVE-ION SOURCE
    ALTON, GD
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (04): : 2450 - 2452
12345