Photoemission microscopy from magnetically coupled thin-film systems

被引：7
|
作者：
Schneider, CM [1 ]
de Haas, O
Muschiol, U
Cramer, N
Oelsner, A
Klais, M
Schmidt, O
Fecher, GH
Jark, W
Schönhense, G
机构：
[1] Inst Solid State & Mat Res Dresden, Dresden, Germany
[2] Univ Colorado, Dept Engn, Colorado Springs, CO 80907 USA
[3] Univ Mainz, Inst Phys, D-6500 Mainz, Germany
[4] ELETTRA, Trieste, Italy
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2001年 / 233卷 / 1-2期
关键词：
photoemission; microscopy; interlayer coupling; exchange biasing;
D O I：
10.1016/S0304-8853(01)00219-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The magnetic microstructure and magnetic coupling phenomena in thin-film systems, relevant for applications in magneto-electronics, are investigated by means of photoemission electron microscopy. Element-selective magnetic information is obtained by exploiting magnetic circular dichroism in the soft X-ray regime. The domain shape and sizes found at the surface of anti ferromagnetically coupled metallic multilayers indicate the presence of a ferromagnetic coupling contribution, presumably caused by a build-up of roughness during the growth process, The magnetic domain patterns in FeNi microstructures on sputtered NiO films reflect the presence of a local exchange anisotropy, causing the phenomenon of exchange biasing or pinning of the ferromagnetic layer. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：14 / 20
页数：7
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