Contour offset algorithm for precise patterning in two-photon polymerization

被引:32
|
作者
Lim, TW [1 ]
Park, SH [1 ]
Yang, DY [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Mech Engn, Taejon 305701, South Korea
关键词
D O I
10.1016/j.mee.2005.01.022
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A contour offset algorithm (COA) has been developed to fabricate precise patterns easily in the range of several microns using a nano-replication printing (nRP) process, which employs two-photon polymerization. In this process, microscale patterns are fabricated by a voxel matrix scanning method that uses raster graphic data transformed from the two-tone (black and white) bitmap figure file. The raster data consist of two kinds of entities to control laser on/off, '1' for laser-on and '0' for laser-off. However, the replicated patterns did not precisely coincide with an initial design due to an intrinsic shortage of the nRP process: the fabricated patterns become generally larger than the designed shape. To solve the point at issue, the COA was proposed in this work: an outer-contour matrix of an initial design was reconstructed then, it was modified by the amounts of offset-ratio that can be calculated using the relation of a pattern size, a designed figure size, and a voxel size. The effectiveness of the proposed algorithm was evaluated through several examples with 200 nm resolution. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:382 / 388
页数:7
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