Enhanced efficiency of near-UV LEDs by surface plasmon and magnetic field effects from metal films

被引:0
|
作者
Hong, Sang-Hyun [1 ]
Kim, Jae-Joon [2 ]
Kim, Byeong-Hyeok [3 ]
Kim, Na-Yeong [4 ]
Kang, Jang-Won [5 ]
机构
[1] Gwangju Inst Sci & Technol, GIST Cent Res Facil, Gwangju 61005, South Korea
[2] Gwangju Inst Sci & Technol, Sch Mat Sci & Engn, Gwangju 56212, South Korea
[3] Korea Atom Energy Res Inst, Adv Radiat Technol Inst, Jeolabuk Do 61005, South Korea
[4] Gwangju Inst Sci & Technol, Adv Photon Res Inst, Gwangju 61005, South Korea
[5] Mokpo Natl Univ, Dept Phys, Muan 58554, Jeollanam Do, South Korea
来源
关键词
Surface plasmon; Magnetic field; Light-emitting Diode; Near-ultraviolet; Flip-chip; LIGHT-EMITTING-DIODES; INDUCED LOCALIZATION;
D O I
10.36410/jcpr.2022.23.2.121
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The enhanced efficiency of the near-UV (NUV) LEDs was demonstrated by the combinatory effects of surface plasmons (SP) from the Ag p-electrode and out-of-plane magnetic fields from additional Co/Pt multi-layers. By utilizing an InGaN/GaN-based NUV-LED epilayer including either 100 or 40 nm p-GaN layers, four different flip-chip LEDs were fabricated by selectively adding Co/Pt ferromagnetic multi-layers on the Ag p-electrode. NUV-LEDs with Co/Pt ferromagnetic multi-layers on 100-nm-thick p-GaN showed a 10.1% enhancement of integrated electroluminescence (EL) intensity at a forward current of 20 mA, mainly due to the out-of-plane magnetic field effect. In LEDs with a 40 nm p-GaN layer, which is consistent with the penetration depth of SP fields, a further increase of 13.8% can be achieved in the integrated EL intensity at 20 mA, resulted from the additional coupling effect with SP fields. These results indicate that the combination of Ag and Co/Pt multilayers, as the p-electrode of flip-chip LEDs, can increase the efficiency in NUV flip-chip LEDs due to efficient couplings of SP fields and an out-of-plane magnetic field with carriers injected into quantum wells.
引用
收藏
页码:121 / 125
页数:5
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