Effect of protection diodes on the behavior of CMOS gates in the presence of supply dips

被引：0
|
作者：
Amer, HH
机构：
来源：
1997 CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, CONFERENCE PROCEEDINGS, VOLS I AND II: ENGINEERING INNOVATION: VOYAGE OF DISCOVERY | 1997年
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D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
This paper shows that, in some CMOS logic gates, the protection diodes may decrease the probability of occurrence of transient failures due to power supply dips. Furthermore, it is observed that protection diodes make output voltage sensitive to some input vectors more than others.
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页码：536 / 539
页数：4
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