Diffusion anisotropy of Ti in zircon and implications for Ti-in-zircon thermometry

被引:22
|
作者
Bloch, E. M. [1 ]
Jollands, M. C. [1 ,2 ]
Tollan, P. [3 ]
Plane, F. [1 ]
Bouvier, A-S [1 ]
Hervig, R. [4 ]
Berry, A. J. [5 ]
Zaubitzer, C. [6 ]
Escrig, S. [1 ,7 ]
Muntener, O. [1 ]
Ibanez-Mejia, M. [8 ]
Alleon, J. [1 ]
Meibom, A. [1 ,7 ]
Baumgartner, L. P. [1 ]
Marin-Carbonne, J. [1 ]
Newville, M. [9 ]
机构
[1] Univ Lausanne, Fac Geosci & Environm, Inst Earth Sci, CH-1015 Lausanne, Switzerland
[2] Columbia Univ, Lamont Doherty Earth Observ, Palisades, NY 10964 USA
[3] Swiss Fed Inst Technol, Inst Geochem & Petrol, Clausiusstr 25, CH-8092 Zurich, Switzerland
[4] Arizona State Univ, Sch Earth & Space Explorat, Tempe, AZ 85281 USA
[5] Australian Natl Univ, Res Sch Earth Sci, Canberra, ACT 2601, Australia
[6] Swiss Fed Inst Technol, Sci Ctr Opt & Electron Microscopy ScopeM, CH-8093 Zurich, Switzerland
[7] Ecole Polytech Fed Lausanne, Sch Architecture Civil & Environm Engn, Lab Biol Geochem, CH-1015 Lausanne, Switzerland
[8] Univ Arizona, Dept Geosci, Tucson, AZ 85721 USA
[9] Univ Chicago, Ctr Adv Radiat Sources, Chicago, IL 60637 USA
基金
瑞士国家科学基金会; 美国国家科学基金会;
关键词
Ti-in-zircon; thermometry; zircon; diffusion; diffusion anisotropy; LITHIUM ISOTOPE FRACTIONATION; FE-MG DIFFUSION; RADIATION-DAMAGE; HELIUM DIFFUSION; CRYSTAL; OLIVINE; INTERDIFFUSION; MECHANISMS; CHEMISTRY; MELTS;
D O I
10.1016/j.epsl.2021.117317
中图分类号
P3 [地球物理学]; P59 [地球化学];
学科分类号
0708 ; 070902 ;
摘要
Ti-in-zircon thermometry has become a widely used tool to determine zircon crystallization temperatures, in part due to reports of extremely sluggish Ti diffusion perpendicular to the crystallographic c-axis in this mineral. We have conducted Ti-in-zircon diffusion experiments, focusing on diffusion parallel to the c-axis, at 1 atm pressure between 1100 and 1540 degrees C, with oxygen fugacities equivalent to air and the Ni-NiO buffer. There is no resolvable dependence of Ti diffusion in zircon upon silica or zirconia activity, or upon oxygen fugacity. The diffusion coefficient of Ti in zircon is found to be a weak function of its own concentration, spanning less than 0.5 log units across any profile induced below 1300 degrees C. Ti diffusion in zircon, parallel to the c-axis at 1 atm pressure, is well described using: log(10) D-Ti = [1.34(+/- 1.44) - 555425(+/- 44820) Jmol(-1)/2.303 RT (K)]m(2)s(-1) where R is the gas constant in J/(mol.K). In conjunct . on with diffusion coefficients for Ti in zircon perpendicular to the c-axis reported by Cherniak and Watson (2007), strong diffusion anisotropy for Ti in zircon is observed. Diffusion parallel to the c-axis is similar to 4-5 orders of magnitude faster than diffusion perpendicular to the c-axis within the experimentally constrained temperature range shared between these two studies (1540-1350 degrees C). This difference increases if the data are extrapolated to lower temperatures and reaches similar to 7.5-11 orders of magnitude between 950-600 degrees C, a typical range for zircon crystallization. Diffusion of Ti in natural zircons will predominantly occur parallel to the c-axis, and the Ti-in-zircon thermometer appears susceptible to diffusive modification under some crustal conditions. Temperatures calculated using this system should therefore be evaluated on a case-by-case basis, particularly when considering high-T, slowly cooled, reheated and/or small zircons. (C) 2021 Elsevier B.V. All rights reserved.
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页数:15
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