ESD protection trends in portable devices

被引:0
|
作者
Russell, B [1 ]
Geske, H [1 ]
机构
[1] Semtech, Newbury Park, CA USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:37 / 38
页数:2
相关论文
共 50 条
  • [31] ESD protection of double-diffusion devices in submicron CMOS processes
    Concannon, A
    Vashchenko, VA
    Hopper, P
    Ter Beek, M
    [J]. ESSDERC 2004: PROCEEDINGS OF THE 34TH EUROPEAN SOLID-STATE DEVICE RESEARCH CONFERENCE, 2004, : 261 - 264
  • [32] A Quantitative Inquisition into ESD Sensitivity to Strain in Nanoscale CMOS Protection Devices
    Sarkar, Deblina
    Thijs, Steven
    Linten, Dimitri
    Russ, Christian
    Gossner, Harald
    Banerjee, Kaustav
    [J]. 2010 INTERNATIONAL ELECTRON DEVICES MEETING - TECHNICAL DIGEST, 2010,
  • [33] Layout Geometry Impact on DDSCR Devices for High Voltage ESD Protection
    Wang, Yang
    Chen, Xijun
    Hao, Shanwan
    Jin, Xiangliang
    [J]. 2018 3RD IEEE INTERNATIONAL CONFERENCE ON INTEGRATED CIRCUITS AND MICROSYSTEMS (ICICM), 2018, : 192 - 195
  • [34] Analysis of reliability and optimization of ESD protection devices supported by modeling and simulation
    Chvala, A.
    Donoval, D.
    Beno, P.
    Marek, J.
    Pribytny, P.
    Molnar, M.
    [J]. MICROELECTRONICS RELIABILITY, 2012, 52 (06) : 1031 - 1038
  • [35] Electrical Characteristics of Novel ESD Protection Devices for I/O Clamp
    Park, Wonsuk
    Lee, Byungseok
    Kim, Dongsu
    Song, Bobae
    Koo, Yongseo
    [J]. TENCON 2012 - 2012 IEEE REGION 10 CONFERENCE: SUSTAINABLE DEVELOPMENT THROUGH HUMANITARIAN TECHNOLOGY, 2012,
  • [36] Thermally-driven motion of current filaments in ESD protection devices
    Pogany, D
    Bychikhin, S
    Denison, M
    Rodin, P
    Jensen, N
    Groos, G
    Stecher, M
    Gornik, E
    [J]. SOLID-STATE ELECTRONICS, 2005, 49 (03) : 421 - 429
  • [37] Reliability of ESD protection devices designed in a 3D technology
    Courivaud, B.
    Nolhier, N.
    Ferru, G.
    Bafleur, M.
    Caignet, F.
    [J]. MICROELECTRONICS RELIABILITY, 2014, 54 (9-10) : 2272 - 2277
  • [38] Characterization of ESD Protection Devices under Total Ionizing Dose Irradiation
    Liang, Wei
    Alexandrou, Kostas
    Klebanov, Maxim
    Kuo, Chung-Chen
    Kymissis, Ioannis
    Sundaram, Kalpathy B.
    Liou, Juin J.
    [J]. 2017 IEEE 24TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2017,
  • [39] ESD-degradation mechanisms of GaAs microwave devices and device protection
    Bock, K.
    Hartnagel, H.-L.
    [J]. Microelectronics Reliability, 1993, 33 (09) : 1397 - 1410
  • [40] Melt filaments in n(+)pn(+) lateral bipolar ESD protection devices
    Clark, NK
    Parat, K
    Maloney, TJ
    Kim, YD
    [J]. JOURNAL OF ELECTROSTATICS, 1996, 38 (1-2) : 113 - 129