Use and verification of digital image correlation for automated 3-D surface characterization in the scanning electron microscope

被引:33
|
作者
Lockwood, WD [1 ]
Reynolds, AP [1 ]
机构
[1] Univ S Carolina, Dept Engn Mech, Columbia, SC 29208 USA
关键词
D O I
10.1016/S1044-5803(98)00052-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ln this article a technique for automatically characterizing the three-dimensional geometry of fracture surfaces is presented. The technique described utilizes digital image correlation (DIC) to provide an accurate and fast method of digitally reconstructing fracture surfaces from stereo pairs produced in the scanning electron microscope (SEM). Accuracy of photogrammetric relationships, based on the geometry of image formation in the SEM, and errors due to scan distortions are quantified. The technique is used to measure features of known geometry and then applied to a turbine blade, for surface roughness measurement, and a fatigue fracture surface for profile analysis. (C) Elsevier Science Inc., 1999. All rights reserved.
引用
收藏
页码:123 / 134
页数:12
相关论文
共 50 条
  • [1] 3-D Image Reconstruction in the Scanning Electron Microscope
    Vanderlinde, William E.
    [J]. ISTFA 2008: CONFERENCE PROCEEDINGS FROM THE 34TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2008, : 515 - 523
  • [2] Application of a digital scanning laser microscope to 3-D analysis of contact surface damages
    Hasegawa, M
    Makimoto, J
    Sawa, K
    [J]. IEICE TRANSACTIONS ON ELECTRONICS, 2003, E86C (06): : 932 - 938
  • [3] Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope
    A. D. Kammers
    S. Daly
    [J]. Experimental Mechanics, 2013, 53 : 1333 - 1341
  • [4] Self-Assembled Nanoparticle Surface Patterning for Improved Digital Image Correlation in a Scanning Electron Microscope
    Kammers, A. D.
    Daly, S.
    [J]. EXPERIMENTAL MECHANICS, 2013, 53 (08) : 1333 - 1341
  • [5] An automated image alignment system for the scanning electron microscope
    Rosolen, GC
    King, WD
    [J]. SCANNING, 1998, 20 (07) : 495 - 500
  • [6] Correction of Scanning Electron Microscope Imaging Artifacts in a Novel Digital Image Correlation Framework
    Maraghechi, S.
    Hoefnagels, J. P. M.
    Peerlings, R. H. J.
    Rokos, O.
    Geers, M. G. D.
    [J]. EXPERIMENTAL MECHANICS, 2019, 59 (04) : 489 - 516
  • [7] Correction of Scanning Electron Microscope Imaging Artifacts in a Novel Digital Image Correlation Framework
    S. Maraghechi
    J. P. M. Hoefnagels
    R. H. J. Peerlings
    O. Rokoš
    M. G. D. Geers
    [J]. Experimental Mechanics, 2019, 59 : 489 - 516
  • [8] 3-D VISION FEEDBACK FOR NANOHANDLING MONITORING IN A SCANNING ELECTRON MICROSCOPE
    Jaehnisch, Marco
    Fatikow, Sergej
    [J]. INTERNATIONAL JOURNAL OF OPTOMECHATRONICS, 2007, 1 (01) : 4 - 26
  • [9] 3D Surface Measurement with a Scanning Electron Microscope
    Vynnyk, Taras
    Fahlbusch, Thomas
    Reithmeier, Eduard
    [J]. TM-TECHNISCHES MESSEN, 2009, 76 (11) : 496 - 502
  • [10] Characterization of Biocompatible Materials Using Stereo Microscope 3D Digital Image Correlation
    Rusin, Tomasz
    Kopernik, Magdalena
    [J]. ADVANCED ENGINEERING MATERIALS, 2016, 18 (09) : 1651 - 1660