Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel

被引：0
|
作者：
Che, Y [1 ]
Shen, YZ [1 ]
Liu, JO [1 ]
机构：
[1] Changchun Inst Opt & Fine Mech, Dept Electroopt Engn, Changchun 130022, Peoples R China
来源：
AUTOMATED OPTICAL INSPECTION FOR INDUSTRY: THEORY, TECHNOLOGY, AND APPLICATIONS II | 1998年 / 3558卷
关键词：
optoelectronic information procession; optoelectronic probe;
D O I：
10.1117/12.318381
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
An optoelectronic detecting instrument is introduced, in which the charge - coupled device(CCD) is used to detect the roundness of internal aperture in artillery barrel. In this paper, we expound the working principle and the design idea, and analyse the measuring error of it.
引用
收藏
页码：186 / 190
页数：5
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